Technical Program

IFS-L2: Information Forensics and Security II

Session Type: Lecture
Time: Thursday, May 16, 15:30 - 17:30
Location: Syndicate 4
Session Chair: Paolo Bestagini, Politecnico di Milano
 
IFS-L2.1: SIMILARITY LEARNING FOR AUTHORSHIP VERIFICATION IN SOCIAL MEDIA
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Benedikt Boenninghoff; Ruhr-Universität Bochum
         Robert M. Nickel; Bucknell University
         Steffen Zeiler; Ruhr-Universität Bochum
         Dorothea Kolossa; Ruhr-Universität Bochum
 
IFS-L2.2: CROSS-VIEW IDENTICAL PART AREA ALIGNMENT FOR PERSON RE-IDENTIFICATION
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Dongshu Xu; Wuhan University
         Jun Chen; Wuhan University
         Chao Liang; Wuhan University
         Zheng Wang; National Institute of Informatics
         Ruimin Hu; Wuhan University
 
IFS-L2.3: PREWARPING SIAMESE NETWORK: LEARNING LOCAL REPRESENTATIONS FOR ONLINE SIGNATURE VERIFICATION
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Xiaomeng Wu; NTT Corporation
         Akisato Kimura; NTT Corporation
         Seiichi Uchida; Kyushu University
         Kunio Kashino; NTT Corporation
 
IFS-L2.4: ALL FOR ONE: FRAME-WISE RANK LOSS FOR IMPROVING VIDEO-BASED PERSON RE-IDENTIFICATION
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Navaneet K L; Indian Institute of Science
         Vasudha Todi; Indian Institute of Science
         Venkatesh Babu Radhakrishnan; Indian Institute of Science
         Anirban Chakraborty; Indian Institute of Science
 
IFS-L2.5: ON THE ADVERSARIAL ROBUSTNESS OF SUBSPACE LEARNING
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Fuwei Li; University of California, Davis
         Lifeng Lai; University of California, Davis
         Shuguang Cui; University of California, Davis
 
IFS-L2.6: CLONABILITY OF ANTI-COUNTERFEITING PRINTABLE GRAPHICAL CODES: A MACHINE LEARNING APPROACH
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Olga Taran; University of Geneva
         Slavi Bonev; University of Geneva
         Slava Voloshynovskiy; University of Geneva