Technical Program

SS-L3: Recent Advances in Signal Processing for Large-Scale Computational Imaging

Session Type: Lecture
Time: Wednesday, May 15, 13:30 - 15:30
Location: Syndicate 2
Session Chair: Adam Scholefield, Ecole polytechnique fédérale de Lausanne
 
SS-L3.1: SIGNPROX: ONE-BIT PROXIMAL ALGORITHM FOR NONCONVEX STOCHASTIC OPTIMIZATION
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Xiaojian Xu; Washington University in St. Louis
         Ulugbek Kamilov; Washington University in St. Louis
 
SS-L3.2: DEAD TIME COMPENSATION FOR HIGH-FLUX DEPTH IMAGING
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Joshua Rapp; Boston University
         Yanting Ma; Boston University
         Robin Dawson; Charles Stark Draper Laboratory
         Vivek Goyal; Boston University
 
SS-L3.3: COMPRESSIVE SINGLE-PIXEL FOURIER TRANSFORM IMAGING USING STRUCTURED ILLUMINATION
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Amirafshar Moshtaghpour; UCLouvain
         José M. Bioucas-Dias; Universidade de Lisboa
         Laurent Jacques; UCLouvain
 
SS-L3.4: 3D RECONSTRUCTION USING SINGLE-PHOTON LIDAR DATA EXPLOITING THE WIDTHS OF THE RETURNS
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Julian Tachella; Heriot-Watt University
         Yoann Altmann; Heriot-Watt University
         Jean-Yves Tourneret; University of Toulouse
         Stephen McLaughlin; Heriot-Watt University
 
SS-L3.5: CONVOLUTIONAL DICTIONARY REGULARIZERS FOR TOMOGRAPHIC INVERSION
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Singanallur Venkatakrishnan; Oak Ridge National Laboratory
         Brendt Wohlberg; Los Alamos National Laboratory
 
SS-L3.6: GEOMETRY OF DEEP LEARNING FOR MAGNETIC RESONANCE FINGERPRINTING
Manuscript Link:  Click here to view manuscript on IEEE Xplore
         Mohammad Golbabaee; University of Bath
         Dongdong Chen; University of Edinburgh
         Pedro Gomez; Technical University of Munich
         Marion Menzel; GE Healtcare
         Michael Davies; University of Edinburgh